DocumentCode :
2224075
Title :
Order parameters for minimax entropy distributions: when does high level knowledge help?
Author :
Yuille, A.L. ; Coughlan, James ; Zhu, Song Chun ; Wu, Yingnian
Author_Institution :
Smith-Kettlewell Eye Res. Inst., San Francisco, CA, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
558
Abstract :
Many problems in vision can be formulated as Bayesian inference. It is important to determine the accuracy of these inferences and how they depend on the problem domain. In recent work, Coughlan and Yuille showed that, for a restricted class of problems, the performance of Bayesian inference could be summarized by an order parameter K which depends on the probability distributions which characterize the problem domain. In this paper we generalize the theory of order parameters so that it applies to domains for which the probability models can be obtained by Minimax Entropy learning theory. By analyzing order parameters it is possible to determine whether a target can be detected using a general purpose “generic” model or whether a more specific “high-level” model is needed. At critical values of the order parameters the problem becomes unsolvable without the addition of extra prior knowledge
Keywords :
computer vision; inference mechanisms; Bayesian inference; Minimax Entropy learning theory; high level knowledge; minimax entropy distributions; order parameters; Bayesian methods; Computer vision; Electrical capacitance tomography; Entropy; Information science; Minimax techniques; Probability distribution; Roads; Statistics; Target tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
Conference_Location :
Hilton Head Island, SC
ISSN :
1063-6919
Print_ISBN :
0-7695-0662-3
Type :
conf
DOI :
10.1109/CVPR.2000.855869
Filename :
855869
Link To Document :
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