• DocumentCode
    2224600
  • Title

    Library building technique for high-reliability submicron ASIC

  • Author

    Longwang, Wang ; Jiancheng, Li

  • Author_Institution
    Beijing Microelectron. Technol. Inst., China
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    163
  • Lastpage
    166
  • Abstract
    This paper describes the technique of submicron ASIC design on reliability and the methodology of ASIC library building. Additionally, this paper has represented the results of the research
  • Keywords
    application specific integrated circuits; circuit CAD; integrated circuit design; integrated circuit reliability; software libraries; library building technique; reliability; submicron ASIC design; Application specific integrated circuits; Buildings; Current density; Hot carrier effects; Inductance; Libraries; Semiconductor device modeling; Semiconductor process modeling; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2001. Proceedings. 4th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6677-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2001.982522
  • Filename
    982522
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2224600