Title : 
Effects of task and EEG-based reference signal on performance of on-line ocular artifact removal from real EEG
         
        
            Author : 
Noureddin, Borna ; Lawrence, Peter D. ; Birch, Gary E.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
         
        
        
            fDate : 
April 29 2009-May 2 2009
         
        
        
        
            Abstract : 
The effects of two factors on the performance of online ocular artifact (OA) removal methods on real electroencephalogram (EEG) data are evaluated. A new metric is proposed that captures both the amount of artifact removed and the likelihood that a given method would distort the underlying EEG. The metric is then used to measure the performance of an existing on-line OA removal algorithm during periods of (i) eye movements and blinks (EM), (ii) a motor related potential (MRP), and (iii) neither EM nor MRP. The results show that the performance of the algorithm is significantly (p<.05) affected by both EM and MRP. Also, the algorithm-like many others-requires a reference electro-oculogram (EOG) signal, yet for certain applications (e.g., a brain computer interface or BCI) it is preferable or necessary to avoid attaching electrodes around the eyes. Thus, the new metric is also used to investigate the effects of using 3 frontal EEG channels as the reference signal instead of EOG. The results show that replacing the EOG with the selected 3 EEG channels does not significantly (p<.05) affect the performance of the algorithm, making it a viable option for online applications where the use of EOG is not suitable (e.g., BCI).
         
        
            Keywords : 
electroencephalography; eye; medical signal processing; neurophysiology; EEG-based reference signal; electroencephalogram; electrooculogram; eye movement; motor related potential; on-line ocular artifact removal algorithm; Application software; Brain computer interfaces; Brain modeling; Distortion measurement; Electrodes; Electroencephalography; Electrooculography; Materials requirements planning; Neural engineering; Signal processing;
         
        
        
        
            Conference_Titel : 
Neural Engineering, 2009. NER '09. 4th International IEEE/EMBS Conference on
         
        
            Conference_Location : 
Antalya
         
        
            Print_ISBN : 
978-1-4244-2072-8
         
        
            Electronic_ISBN : 
978-1-4244-2073-5
         
        
        
            DOI : 
10.1109/NER.2009.5109371