DocumentCode
2224949
Title
Shunt detection and performance characterization of silicon solar cells using thermoreflectance imaging
Author
Zhou, Qiaoer ; Hu, Xiaolin ; Al-hemyari, Kadhair ; McCarthy, Kevin ; Domash, Lawrence ; Hudgings, Janice
Author_Institution
Alenas Imaging, Inc., Conway, MA, USA
fYear
2011
fDate
1-6 May 2011
Firstpage
1
Lastpage
2
Abstract
Thermoreflectance is quantitatively compared with lock-in IR thermography for NDE of solar cells. The order of magnitude enhancement in spatial resolution enables shunt detection as well as extraction of local IV curves, diode parameters, and thermal diffusivity and conductivity.
Keywords
silicon; solar cells; thermal conductivity; thermal diffusivity; thermoreflectance; Si; diode parameters; local IV curves; lock-in IR thermography; nondestructive evaluation techniques; performance characterization; shunt detection; solar cells; thermal conductivity; thermal diffusivity; thermoreflectance imaging; Conductivity; Photovoltaic cells; Silicon; Spatial resolution; Thermal conductivity; Thermoreflectance imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4577-1223-4
Type
conf
Filename
5950023
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