Title :
Shunt detection and performance characterization of silicon solar cells using thermoreflectance imaging
Author :
Zhou, Qiaoer ; Hu, Xiaolin ; Al-hemyari, Kadhair ; McCarthy, Kevin ; Domash, Lawrence ; Hudgings, Janice
Author_Institution :
Alenas Imaging, Inc., Conway, MA, USA
Abstract :
Thermoreflectance is quantitatively compared with lock-in IR thermography for NDE of solar cells. The order of magnitude enhancement in spatial resolution enables shunt detection as well as extraction of local IV curves, diode parameters, and thermal diffusivity and conductivity.
Keywords :
silicon; solar cells; thermal conductivity; thermal diffusivity; thermoreflectance; Si; diode parameters; local IV curves; lock-in IR thermography; nondestructive evaluation techniques; performance characterization; shunt detection; solar cells; thermal conductivity; thermal diffusivity; thermoreflectance imaging; Conductivity; Photovoltaic cells; Silicon; Spatial resolution; Thermal conductivity; Thermoreflectance imaging;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
