DocumentCode :
2225047
Title :
Process capability analysis for life cycle application
Author :
Jeang, Anugs ; Chung, Chien-Ping ; Hung, Chiao-Ju
Author_Institution :
Dept. of Ind. Eng. & Syst. Manage., Feng Chia Univ., Taichung, Taiwan
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
785
Lastpage :
789
Abstract :
Process capability analysis was used to measure and control the quality level of a process in real exercises for an on-line quality management. There is a deficiency in this type of management, namely the defects which occurred in the production process were only detected and modified afterward, and passively. Generally, improvement by the correction of defects is very costly and inefficient. Hence, there is an attempt to broaden the time frame of process capability analysis from the end of process planning or product design, i.e., on-line application, to the beginning of process planning or product design, i.e., off-line application. In this regard, the present research develops a process capability analysis for the application covering pre-production stage, on-production stage, and post-production stage. The new process capability analysis is extended from conventional Cpm with consideration of the balance between production cost and quality loss.
Keywords :
process capability analysis; process planning; product design; quality control; online quality management; process capability analysis; process control; process planning; product design; production cost; production process; quality level control; quality loss; Control systems; Cost function; Design engineering; Engineering management; Industrial engineering; Loss measurement; Process planning; Product design; Production; Quality management; Mean; Process capability analysis; Process planning; Product design; Quality loss; Tolerance; Tolerance cost;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2629-4
Electronic_ISBN :
978-1-4244-2630-0
Type :
conf
DOI :
10.1109/IEEM.2008.4737977
Filename :
4737977
Link To Document :
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