DocumentCode
2225703
Title
Reconstructing optical parameters of planar structures by fringe analysis
Author
Smith, P.R.
Author_Institution
Loughborough Univ. of Technol., UK
fYear
1991
fDate
16-18 Sep 1991
Firstpage
176
Lastpage
179
Abstract
The reconstruction of a set of quantitative parameters from measurements of scattered field intensity is addressed for planar dielectric structures. The information in the scattered field is encoded into conventional interference fringe patterns. A computer simulation for optical illumination is presented in the context of quantitative nondestructive evaluation and the stability to additive noise is investigated
Keywords
light interferometry; light scattering; picture processing; computer simulation; fringe analysis; interference fringe patterns; nondestructive evaluation; optical illumination; optical parameters; planar structures; quantitative parameters; scattered field intensity;
fLanguage
English
Publisher
iet
Conference_Titel
Holographic Systems, Components and Applications, 1991., Third International Conference on
Conference_Location
Edinburgh
Print_ISBN
0-85296-528-1
Type
conf
Filename
152103
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