Title :
Plasmon coupled tip-enhanced near-field optical microscopy
Author :
Bouhelier, A. ; Beversluis ; Novotny
Author_Institution :
Inst. of Opt., Rochester Univ., NY, USA
Abstract :
Summary form only given. Scanning near-field optical microscopy aims at optically resolving subwavelength structures. The most common technique relies on the local excitation of the sample surface by the optical fields near a nano-aperture which is commonly produced at the end of a glass fiber tip. Alternatively, high resolution microscopy can also be achieved by using the local field enhancement produced at the end of a sharp metal tip when illuminated by a highly focused laser beam. By combining these techniques in the form of a sharp metal tip at the end of an overcoated fiber, we propose a new method that does not require the delicate technologies to produce nano-apertures, nor require the intense external focused beam responsible for the field enhancement.
Keywords :
near-field scanning optical microscopy; surface plasmons; cut-off point; evanescent field; high resolution microscopy; linearly polarized mode; local field enhancement; nano-apertures; overcoated fiber; plasmon coupled tip-enhanced microscopy; scanning near-field optical microscopy; sharp metal tip; subwavelength structures; surface plasmons; Plasmons;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-708-3
DOI :
10.1109/QELS.2002.1031211