DocumentCode :
2225852
Title :
Temperature vs. Reliability for Hardened Systems in Substations
Author :
Hammond, Jim
fYear :
2006
fDate :
15-19 Oct. 2006
Abstract :
Electronics cooling is getting increased attention as intelligent systems integrating higher-density components migrate into industrial settings. Product designs need to adapt to harsher conditions than the traditional office environments. Available component temperature ratings are rising, but factors such as component high-heat generation and device packaging density are leading to higher-temperature operating conditions, thus offsetting the gains in heat immunity. This paper evaluates thermal design trade-offs related to reliability and offers some insights worth considering in the design and deployment of industrial systems.
Keywords :
cooling; forced convection; product design; reliability; substations; component high-heat generation; convection cooling; device packaging; electronics cooling; hardened systems; industrial systems; intelligent systems; product designs; rugged systems; thermal design; Electronic packaging thermal management; Electronics cooling; Electronics industry; Intelligent systems; Product design; Reliability engineering; Substations; System testing; Systems engineering and theory; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission & Distribution Construction, Operation and Live-Line Maintenance, 2006. ESMO 2006. IEEE 11th International Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0724-9
Electronic_ISBN :
1-4244-0724-9
Type :
conf
DOI :
10.1109/TDCLLM.2006.340740
Filename :
4144508
Link To Document :
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