• DocumentCode
    2226052
  • Title

    Vision system for on-line surface inspection in aluminum casting process

  • Author

    Fernandez, C. ; Platero, C. ; Campoy, P. ; Aracil, R.

  • Author_Institution
    Dept. of Syst. & Electron., Univ. Politecnica de Madrid, Spain
  • fYear
    1993
  • fDate
    15-19 Nov 1993
  • Firstpage
    1854
  • Abstract
    In this paper an automated visual inspection system is described within a general architecture for the online detection and analysis of surface defects in the production of continuous flat metallic products. Real-time performance requirements result in the development of a high-parallel architecture for high-speed image processing. Matrix cameras are used for image acquisition instead of linear ones because of the surface appearance. Inspection is achieved with 1 mm2 resolution. Similarity-based algorithms as well as texture algorithms have been developed and hardware-implemented for defect detection in a high-textured surface where, for the most of defects, segmentation can not be achieved by only means of threshold techniques. The system has been applied to continuous cast aluminum inspection, where up to fifteen different kinds of defects must be detected and classified. Online defect classification is attempted by means of the formal language theory
  • Keywords
    automatic optical inspection; casting; computer vision; image recognition; image texture; metallurgical industries; parallel architectures; process control; real-time systems; aluminum casting process; automated visual inspection system; formal language; image acquisition; image processing; matrix cameras; online detection; parallel architecture; segmentation; similarity-based algorithms; surface defect detection; texture algorithms; threshold techniques; Aluminum; Cameras; Casting; Continuous production; Image processing; Image segmentation; Inspection; Machine vision; Production systems; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-0891-3
  • Type

    conf

  • DOI
    10.1109/IECON.1993.339356
  • Filename
    339356