• DocumentCode
    2227045
  • Title

    The use of MOS interfaces for GSI and TSI SET-based nanoelectronic processors

  • Author

    da Costa, J.C.

  • Author_Institution
    Dept. of Electr. Eng., Univ. de Brasilia, Brasilia
  • fYear
    2006
  • fDate
    Jan. 30 2006-Feb. 1 2006
  • Firstpage
    279
  • Lastpage
    279
  • Abstract
    Summary form only given. The realization of extremely dense integrated circuits, having from 109 to beyond 1012 devices per chip presents several challenges to current I.C. fabrication technologies. Among them, power dissipation seems to be one of the most difficult hurdles to overcome. Nowadays, nanoelectronic devices seem to be an attractive alternative to MOS devices for the implementation of these GSI to TSI integrated circuits. Single electron tunneling (SET) - based transistors are well-known for their extremely low power consumption and high-scale integration capability and should be an interesting option for the implementation of extremely dense I.C.s . However, their limited driving capabilities do not favor the interfacing of SET circuits and other non-SET modules in an electronic system. In this work, the present development of circuit solutions for a GSI/TSI processor (based on single-electron transistors) that is being developed at Universidade de Brasilia will be presented. The possibilities of interfacing these SET-based circuits via MOS devices, in order to overcome the limited SET driving capabilities, will be also discussed.
  • Keywords
    MOS integrated circuits; nanoelectronics; single electron transistors; GSI integrated circuits; GSI/TSI processor; MOS devices; MOS interfaces; TSI integrated circuits; nanoelectronic processors; single electron tunneling; single-electron transistors; Doping; Integrated circuit technology; MOS devices; Nanoscale devices; Particle beams; Plasma applications; Plasma immersion ion implantation; Plasma measurements; Plasma properties; Single electron transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano CMOS, 2006 International Workshop on
  • Conference_Location
    Mishima
  • Print_ISBN
    978-1-4244-0603-6
  • Type

    conf

  • DOI
    10.1109/IWNC.2006.4571001
  • Filename
    4571001