Title :
MHz-rate high-resolution reflectometry by direct mapping of the full axial-line profile in a single-shot oscilloscope trace
Author :
Malacarne, Antonio ; Yongwoo Park ; Azaña, Jose
Author_Institution :
Centre Energie Mater. Telecommun., Inst. Nat. de la Rech. Sci., Varennes, QC, Canada
Abstract :
A concept is introduced for optical reflectometry based on real-time spectral interference pattern Fourier transformation, enabling direct axial-line mapping with hundreds of sampling points in a single-shot oscilloscope trace at MHz update rates.
Keywords :
Fourier transform optics; light interference; oscilloscopes; reflectometry; direct axial-line mapping; full axial-line profile; high-resolution reflectometry; optical reflectometry; real-time spectral interference pattern Fourier transformation; sampling points; single-shot oscilloscope trace; Biomedical optical imaging; High speed optical techniques; Optical imaging; Optical interferometry; Optical pulses; Optical reflection; Reflectometry;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
