Title :
The near-field microwave microscopy of nanometer metal layers
Author :
Usanov, D.A. ; Nikitov, S.A. ; Skripal, A.V. ; Abramov, A.V. ; Bogolubov, A.S. ; Korotin, B.N. ; Feklistov, V.B. ; Ponomarev, Denis V. ; Frolov, A.P.
Author_Institution :
Saratov State Univ., Saratov, Russia
Abstract :
The description of near-field microwave microscope based on the semiconductor Gunn-diode autodyne oscillator is presented. The probe of the microwave microscope was created on the base on the waveguide-to-microcoaxial adapter with a centre conductor jutted out of the outer conductor. Using the created autodyne near-field microwave microscope the microwave imaging with high space resolution was demonstrated. The relief and electrophysical properties of the ceramic plate surface with the applied metal layer were imaged.
Keywords :
Gunn diodes; Gunn oscillators; coaxial waveguides; conductors (electric); microwave imaging; nanoelectronics; scanning probe microscopy; applied metal layer; centre conductor; ceramic plate surface; electrophysical property; microwave imaging; nanometer metal layers; near-field microwave microscopy; semiconductor Gunn-diode autodyne oscillator; waveguide-to-microcoaxial adapter; Conductors; Metals; Microscopy; Microwave imaging; Microwave oscillators; Probes; Strips;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
