• DocumentCode
    2227712
  • Title

    Programmable Josephson AC-voltages will work well for analog DFT for mixed-signal ICs under background noise even up to 20 nanovolts

  • Author

    Zhang, Fuhong ; Zhao, Guo-Nan

  • Author_Institution
    Hangzhou Inst. of Electron. Eng., China
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    641
  • Lastpage
    645
  • Abstract
    Programmable Josephson AC-voltage has reached an accuracy of 10 -6 at about hundreds of mv with its frequency about several tens of Hz and downwards. The nodal voltage referred to common ground to be measured for analog design-for-testability (DFT) for mixed-signal ICs ranges from several tens of mv and downwards with its frequency at about one hundred Hz and downwards. Computer simulation thus shows that analog DFT under background noise up to 20 nanovolts with programmable AC-Josephson voltage as a testing voltage will work well and moreover have good behaviour. A comparison of both optimum identification ratio of element parameters between programmable ac Josephson voltage of their lower frequency 4.375-140 Hz under background noise 1 nv, 20 nv and with signal voltage of their higher frequency 125~4 kHz under background noise 1 nv. 10 nv is thus required. The paper gives a brief review of the idea of symbolic analysis as the op-amp type analog parts of the mixed signal IC prevail
  • Keywords
    design for testability; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; network parameters; symbol manipulation; 1 to 20 nV; 125 to 4 kHz; 4.375 to 140 Hz; analog DFT; analog design-for-testability; background noise; element parameters; mixed-signal ICs; nodal voltage; op-amp type analog parts; optimum identification ratio; programmable Josephson AC-voltages; symbolic analysis; testing voltage; Analog integrated circuits; Background noise; Computer simulation; Design for testability; Frequency measurement; Operational amplifiers; Signal analysis; Signal processing; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2001. Proceedings. 4th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6677-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2001.982645
  • Filename
    982645