• DocumentCode
    2227934
  • Title

    QFP package analysis using partial element equivalent circuits

  • Author

    Jiang, Qifeng ; Cao, Yi ; Li, Zhengfan

  • Author_Institution
    Shanghai Jiao Tong Univ., China
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    685
  • Lastpage
    688
  • Abstract
    The partial element equivalent circuit (PEEC) technique is employed to model the electrical properties of the generic 64-lead quad-flat-pack (QFP). The model for the package includes many details, such as the leads, bonding wires and finite-size dielectrics. This model is used to investigate the parasitic effect of the package. As an example, the equivalent circuit is used to simulate the simultaneous switching noise (SSN) in conjunction with the devices on the chip
  • Keywords
    equivalent circuits; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; lead bonding; 64-lead quad-flat-pack; PEEC technique; QFP package analysis; bonding wires; electrical properties modeling; finite-size dielectrics; leads; package parasitic effect; partial element equivalent circuits; simultaneous switching noise; Bonding; Circuit simulation; Conductors; Coupling circuits; Dielectrics; Electronics packaging; Equivalent circuits; Geometry; Lead; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2001. Proceedings. 4th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6677-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2001.982656
  • Filename
    982656