• DocumentCode
    2227973
  • Title

    On change point of mean residual life of parallel systems

  • Author

    Shen, Yan ; Xie, Min ; Tang, Loon Ching

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1405
  • Lastpage
    1407
  • Abstract
    Mean residual life is one of the most important characteristics that can be used to measure the reliability of parallel systems. In literature, mean residual life of parallel systems has been defined in different ways. How are these mean residual life functions related to each other? To answer this question, this paper studies the mean residual life of parallel systems from the point of view of change point, at which the mean residual life function changes its trend. Different definitions of the mean residual life of parallel systems are reviewed and introduced. By comparing the change points of these mean residual life functions graphically, we find that these change points behave in a regular pattern, and all of them are related to the change point for single components in the aspect of location. These results are helpful in the determination of optimal burn-in time.
  • Keywords
    optimisation; reliability theory; remaining life assessment; statistical distributions; change point behavior; cumulative distribution function; mean residual life function; optimal burn-in time; parallel system reliability; probability density function; Aging; Graphics; Probability density function; Random variables; Redundancy; Reliability engineering; Shape; Systems engineering and theory; Testing; Time measurement; Change point; mean residual life; parallel systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2629-4
  • Electronic_ISBN
    978-1-4244-2630-0
  • Type

    conf

  • DOI
    10.1109/IEEM.2008.4738101
  • Filename
    4738101