Title :
(M)MIC analysis using a hierarchy of simulation tools controlled by layout pattern recognition and expert knowledge
Author :
Tadjiky, S. ; Jansen, R.H.
Author_Institution :
Dept. of Electr. Eng., Tech. Hochschule Aachen, Germany
Abstract :
An intelligent Design Assistant has been developed connecting the layout input and the netlist level of a CAD system using a hierarchy of different simulation tools. This design utility represents a new approach based on layout pattern recognition and expert knowledge for automated choice and control of the most suitable tools.
Keywords :
MMIC; circuit CAD; circuit analysis computing; integrated circuit layout; intelligent design assistants; microwave integrated circuits; pattern recognition; CAD; MIC analysis; MMIC analysis; expert knowledge; intelligent design assistant; layout pattern recognition; simulation tools; Analytical models; Automatic control; Conductors; Coupling circuits; Design automation; Expert systems; Layout; Pattern analysis; Pattern recognition; Process design;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.511045
