Title :
A hybrid GA-simulation approach to improve JIT systems
Author :
Azadeh, A. ; Ebrahimipour, V. ; Bavar, P. ; Shojaei, E.
Author_Institution :
Dept. of Ind. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
This study presents a hybrid approach involving genetic algorithms (GA) as an optimization search technique and a simulation model, for representing the dynamic behavior of the system and its limitations, to improve the practical JIT manufacturing system. To achieve the objective, first, the actual system is modeled and simulated (by considering the system¿s limitations and its dynamic behavior). Second, the integrated simulation model is tested and validated by analysis of variance. Third, the hybrid GA-Simulation approach is used in an interactive manner to determine the optimal number of kanban cards in different stations of the practical JIT system. The presented hybrid approach is tested and applied to an auto industry production line. Furthermore, it is compared with the practical JIT through analysis of variance (ANOVA) and the results show improvements in the average daily production rate, the average resource utilization and the average cycle time but some deterioration in the average queue length and in process inventory is inevitable.
Keywords :
genetic algorithms; just-in-time; kanban; statistical analysis; ANOVA; JIT manufacturing system; JIT systems; analysis of variance; auto industry production line; average cycle time; average queue length; average resource utilization; daily production rate; genetic algorithms; just-in-time; kanban cards; process inventory; Analysis of variance; Analytical models; Assembly; Context modeling; Genetic algorithms; Manufacturing systems; Mathematical model; Production systems; Testing; Vehicle dynamics; Analysis of Variance; Genetic Algorithm; Hybrid; Integration; Just-In-Time; Simulation;
Conference_Titel :
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2629-4
Electronic_ISBN :
978-1-4244-2630-0
DOI :
10.1109/IEEM.2008.4738105