Title :
Toward the matrix polarimetry method of thin film coatings
Author :
Pidkamin, L.J. ; Arkhelyuk, A.D. ; Brus, V.V.
Author_Institution :
Chernivtsi Nat. Univ. of Yo.Fedcovicha, Russia
Abstract :
The results obtained from studying the impact of optical-geometrical parameters of thin-layered models containing the particles of different shapes and sizes as well as the degree of orient ability toward their light scattering matrices how been analyzed. A special emphasis is placed upon the peculiar aspects of the matrix polarimetry method and it is in fact expedient to use this technique in implementing and developing the non-destructive methods to control thin film coatings.
Keywords :
coatings; light scattering; nondestructive testing; particle size; polarimetry; thin films; light scattering; matrix polarimetry method; nondestructive methods; optical-geometrical parameters; particle shape; particle size; thin film coatings; thin-layered models; Coatings; Optical films; Optical imaging; Optical polarization; Optical scattering; Shape; Silicon;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
