DocumentCode
2228175
Title
Conductor cross-section moment method applied in integrated circuit interconnects resistance and inductance parameter extraction
Author
Liu, Chenbo ; Li, Zhengfan
Author_Institution
Shanghai Jiao Tong Univ., China
fYear
2001
fDate
2001
Firstpage
720
Lastpage
723
Abstract
This paper introduces the conductor cross section moment method to extract the resistance parameter of IC interconnects (relatively upper layer according to six layer structure). The inductance parameter can be obtained at the same time. Results are presented for the cases of a single line and two current return paths, two lines and two current return paths, and four lines and four current return paths
Keywords
electric resistance; inductance; integrated circuit interconnections; integrated circuit modelling; method of moments; parameter estimation; conductor cross-section moment method; current return paths; inductance parameter extraction; integrated circuit interconnects; resistance parameter extraction; six layer structure; Conductors; Frequency; Inductance; Integrated circuit interconnections; Microprocessors; Moment methods; Parameter extraction; Skin effect; Transmission line matrix methods; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2001. Proceedings. 4th International Conference on
Conference_Location
Shanghai
Print_ISBN
0-7803-6677-8
Type
conf
DOI
10.1109/ICASIC.2001.982665
Filename
982665
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