Title :
Synthesis and structural properties of ZnS nanostructures
Author :
Kurbatov, D.I. ; Opanasyuk, A.S. ; Sofronov, D.S. ; Danilchenko, S.M. ; Protsenko, I.Y.
Author_Institution :
Sumy State Univ., Sumy, Ukraine
Abstract :
In this work the technology of deposition of ZnS nanostructures obtained by close-spaced vacuum sublimation technique (CSVS) is described. The some structural properties of these nanostructures are investigated. Examination of layers morphology and structure was performed by high-resolution electron microscopy and X-ray diffraction method respectively. Results of these studies enabled to determine dependence of the main structural film parameters (phase, lattice parameters, grain sizes etc.) on the growth conditions.
Keywords :
II-VI semiconductors; X-ray diffraction; nanofabrication; nanostructured materials; semiconductor growth; semiconductor thin films; sublimation; vacuum deposition; zinc compounds; X-ray diffraction method; ZnS; close-spaced vacuum sublimation technique; grain size; high-resolution electron microscopy; layers morphology; nanostructures; structural film parameters; structural properties; Films; Lattices; Nanostructures; Substrates; X-ray diffraction; Zinc oxide;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
