Title :
Investigation of nanostructured silicon surfaces using fractal analysis
Author :
Smyntyna, V.A. ; Kulinich, O.A. ; Iatsunskyi, I.R. ; Marchuk, I.A. ; Pavlenko, N.N.
Author_Institution :
Fac. of Phys., Odessa I.I. Mechnikov Nat. Univ., Odessa, Ukraine
Abstract :
Fractal analysis was applied to images of nanostructured silicon surfaces which were acquired with a scanning electron microscope. A fractal model describing nanostructured silicon surfaces morphology is elaborated. It were obtained the numerical results for the fractal dimensions for 2 samples with different nanostructured shapes.
Keywords :
elemental semiconductors; fractals; nanostructured materials; numerical analysis; scanning electron microscopy; silicon; surface morphology; Si; fractal analysis; fractal dimensions; fractal model; nanostructured silicon surfaces; numerical analysis; scanning electron microscopy; surface morphology; Fractals; Nanobioscience; Shape; Silicon; Surface morphology; Surface roughness; Surface treatment;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
