• DocumentCode
    2228715
  • Title

    An Immune Fault Detection System with Automatic Detector Generation by Genetic Algorithms

  • Author

    Amaral, Jorge L M ; Amaral, José F M ; Morin, Daniel ; Tanscheit, Ricardo

  • Author_Institution
    Rio de Janeiro State Univ., Rio de Janeiro
  • fYear
    2007
  • fDate
    20-24 Oct. 2007
  • Firstpage
    283
  • Lastpage
    288
  • Abstract
    This work deals with fault detection of electronic analog circuits. A fault detection system for analog circuits based on cross-correlation and artificial immune systems is proposed. It is capable of detecting faulty components in analog circuits by analyzing its impulse response. The use of cross-correlation for preprocessing the impulse response drastically reduces the size of the detector used by the real-valued negative selection algorithm (RNSA). The proposed method makes use of genetic algorithms to automatically generate a small number of very efficient detectors. Results have demonstrated that the proposed system is able to detect faults in a Sallen-Key bandpass filter and in a universal filter.
  • Keywords
    analogue circuits; artificial immune systems; band-pass filters; fault location; genetic algorithms; transient response; Sallen-Key bandpass filter; artificial immune systems; automatic detector generation; cross-correlation; electronic analog circuits; genetic algorithms; immune fault detection system; impulse response; real-valued negative selection algorithm; Analog circuits; Artificial immune systems; Circuit faults; Circuit testing; Detectors; Electrical fault detection; Fault detection; Fault diagnosis; Genetic algorithms; Immune system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems Design and Applications, 2007. ISDA 2007. Seventh International Conference on
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    978-0-7695-2976-9
  • Type

    conf

  • DOI
    10.1109/ISDA.2007.116
  • Filename
    4389622