An efficient approach to device parameter extraction for statistical IC modeling

Author

Qu, Ming ; Styblinski, M.A.

Author_Institution

Nat. Semicond. Corp., Santa Clara, CA, USA

fYear

1996

fDate

5-8 May 1996

Firstpage

329

Lastpage

332

Abstract

A technique called Recursive Inverse Approximation (RIA) has been developed for parameter extraction for statistical IC modeling. High accuracy and efficiency are achieved by the proposed methodology. RIA combines the global optimization, parameter prediction, parameter correction, and accuracy checking. RIA fundamentally solves the accuracy problem in statistical IC parameter extraction. The proposed method is much faster than the optimization-based method. The technique was implemented in SMIC - a program for statistical modeling of integrated circuits

Keywords

circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit modelling; parameter estimation; statistical analysis; SMIC; accuracy checking; device parameter extraction; efficiency; global optimization; parameter correction; parameter prediction; recursive inverse approximation; statistical IC modeling; Application specific integrated circuits; Data mining; Equations; Integrated circuit measurements; Integrated circuit modeling; Noise level; Parameter extraction; Particle measurements; Performance evaluation;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996

Conference_Location

San Diego, CA

Print_ISBN

0-7803-3117-6

Type

conf

DOI

10.1109/CICC.1996.511091

Filename

511091