• DocumentCode
    2229765
  • Title

    Light sources for photonic circuitry based on Si

  • Author

    Ching-Fuh Lin ; Eih-Zhe Liang ; Ting-Wien Su ; Hsing-Hung Hsieh ; Wei-Fang Su ; Miin-Jang Chen

  • Author_Institution
    Graduate Inst. of Electro-Opt. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    252
  • Lastpage
    253
  • Abstract
    Summary form only given. We report the possibility of breaking the indirect-bandgap limitation to efficiently generate light from Si. We theoretically and experimentally discovered that carrier localization could enhance radiative recombination corresponding to bandgap energy of Si for orders of magnitudes. Nearly lasing actions corresponding to Si bandgap energy were even observed with the enhanced radiative recombination. Because of the indirect-bandgap nature of Si, the probability of electron-hole recombination is very low without the involvement of phonons. However, phonon involvement causes the process to be like simultaneous collision of three particles (electron, hole, and phonon), so the probability is also very low. If an electron and a hole already form an exciton, the process will be like a two-particle collision, exciton vs. phonon. The probability then greatly increases. Based on such a concept, we derive a formula for the emission from Si with phonon and exciton involvement. To have the localization of electrons and holes in the same region, we use nanoparticles in the oxide layer of the conventional metal-oxide-semiconductor (MOS) structures. The nanoparticles cause the thickness of the oxide layer to be nonuniform and lead to the following two effects. First, as the MOS structure is forward biased, the band bending of Si toward the thin oxide is more severe than the thick oxide, resulting in three-dimensional potential wells for carrier confinement. Second, in the region with the thin oxide, more carriers tunnel to Si through the thin oxide layer than through the thick oxide layer. As a result, electrons and holes have the similar spatial confinement near the Si/SiO/sub 2/ interface. The above mechanisms significantly enhance the electroluminescence.
  • Keywords
    MIS structures; electroluminescence; elemental semiconductors; energy gap; interface states; light sources; nanoparticles; phonon-exciton interactions; silicon; MOS structure; Si; Si-SiO/sub 2/; Si/SiO/sub 2/ interface; band bending; bandgap energy; carrier confinement; carrier localization; electroluminescence; electron-hole recombination; enhanced radiative recombination; exciton involvement; forward biased; indirect-bandgap limitation; light sources; nanoparticles; nearly lasing actions; oxide layer; phonon involvement; photonic circuitry; probability; radiative recombination; thick oxide; thin oxide; three-dimensional potential wells; two-particle collision; Electroluminescence; Excitons; Interface phenomena; Light sources; Phonons; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Long Beach, CA, USA
  • Print_ISBN
    1-55752-708-3
  • Type

    conf

  • DOI
    10.1109/QELS.2002.1031384
  • Filename
    1031384