Title :
Validation of RF mosfet transistor layout-aware macromodel
Author :
El-Sabban, Aida A. ; Haddara, Hisham ; Ragai, Hani F.
Author_Institution :
VLSI Design Center, AOIE
Keywords :
CMOS integrated circuits; CMOS process; Circuit simulation; Fingers; Integrated circuit modeling; Integrated circuit noise; MOSFET circuits; Radio frequency; Radiofrequency integrated circuits; Semiconductor device modeling;
Conference_Titel :
Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. 2004 International Conference on
Print_ISBN :
0-7803-8575-6
DOI :
10.1109/ICEEC.2004.1374519
