• DocumentCode
    2230103
  • Title

    A simulation study of single events in n+-p junctions

  • Author

    Abadir, G.B. ; Fikry, W. ; Ragai, H.F. ; Omar, O.A.

  • Author_Institution
    Ain Shams University
  • fYear
    2004
  • fDate
    5-7 Sept. 2004
  • Firstpage
    541
  • Lastpage
    544
  • Keywords
    Charge carrier density; Charge carrier lifetime; Discrete event simulation; Doping; Geometry; Mathematical model; Radiative recombination; Semiconductor process modeling; Solid modeling; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. 2004 International Conference on
  • Print_ISBN
    0-7803-8575-6
  • Type

    conf

  • DOI
    10.1109/ICEEC.2004.1374525
  • Filename
    1374525
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2230103