Title :
Genetic algorithm based diode model prameters extraction
Author :
Almashary, Bandar
Author_Institution :
King Saud University
Keywords :
Circuit simulation; Circuit synthesis; Circuit testing; Condition monitoring; Data mining; Genetic algorithms; Optimization methods; P-n junctions; Robustness; Schottky diodes;
Conference_Titel :
Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. 2004 International Conference on
Print_ISBN :
0-7803-8575-6
DOI :
10.1109/ICEEC.2004.1374526
