• DocumentCode
    2230470
  • Title

    Estimating target-induced azimuth envelope for SAR image formation and feature extraction

  • Author

    Yesheng Gao ; Kaizhi Wang ; Xingzhao Liu

  • Author_Institution
    Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    5820
  • Lastpage
    5823
  • Abstract
    Conventional SAR imaging algorithms form SAR image based on imaging geometries, the resulting image indicates the spatial location of illuminated targets with respect to radar platform. Scattering characteristics of targets are overlooked by these algorithms. We construct a model of received SAR signal in terms of (1) envelope, (2) phase, (3) duration, (4) arrival time, (5) frequency center and (6) chirp rate, and the envelope shape can be controlled by two parameters. Arrival time, frequency center and chirp rate indicate the spatial location and motion dynamics of the targets, while information of scattering characteristics can be analyzed from the other parameters. The parameters of the model are then estimated via atomic decomposition. In this paper, the impact of target-induced envelope on data focusing is analyzed, furthermore, target feature can be extracted from a signal-level point of view.
  • Keywords
    feature extraction; geophysical image processing; geophysical techniques; object detection; radar imaging; synthetic aperture radar; SAR image formation; SAR imaging algorithms; arrival time; atomic decomposition; chirp rate; feature extraction; frequency center; imaging geometries; radar platform; received SAR signal model; target motion dynamics; target scattering characteristics; target-induced azimuth envelope estimation; Atomic clocks; Azimuth; Chirp; Feature extraction; Synthetic aperture radar; Time frequency analysis; SAR; atomic decomposition; feature extraction; image formation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6352286
  • Filename
    6352286