Title :
Effects of non-uniform distribution of motion on determinations of piezoelectric coupling and constants using IEEE 176-1987
Author :
Kosinski, J.A. ; Ballato, A. ; Lu, Yang
Author_Institution :
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ
fDate :
31 Oct-3 Nov 1993
Abstract :
The critical frequencies of practical plate resonators are not determined by the intrinsic or “theoretical” values of mass loading and piezoelectric coupling, but by “effective” values owing to the nonuniform distribution of vibratory motion across the plate. The non-uniform distribution of motion effects are not accounted for in the IEEE 176-1987 recommended thin plate measurement methods for determining piezoelectric coupling and constants. Further, the calculations required to correct measured data for the non-uniform distribution of motion effects are non-trivial. Consequently, a measurement approach in which the distribution of motion plays no part has been developed
Keywords :
crystal resonators; piezoelectric oscillations; IEEE 176-1987; critical frequencies; mass loading; motion effects; nonuniform distribution; piezoelectric constants; piezoelectric coupling; practical plate resonators; vibratory motion; Capacitance measurement; Frequency measurement; Measurement standards; Motion analysis; Motion measurement; Piezoelectric materials; Resonance; Resonant frequency; Testing; Vibration measurement;
Conference_Titel :
Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2012-3
DOI :
10.1109/ULTSYM.1993.339552