Title :
Image processing and analysis of digital speckle pattern interferometric images for monitoring/surface vibration/tilt
Author :
Shakher, Chandra ; Matsuda, K. ; Tenjimbayashi, K. ; Sundarajan, N. ; Ravi, D.
Author_Institution :
Laser Applications & Holography Lab., Indian Inst. of Technol., New Delhi, India
Abstract :
A digital speckle pattern interferometric system to monitor surface vibrations and out of plane tilt is presented. The resolution of the system used to measure the out of plane displacement is 1/2 per fringe
Keywords :
computerised monitoring; displacement measurement; electronic speckle pattern interferometry; image resolution; measurement by laser beam; vibration measurement; digital speckle pattern interferometric images; image analysis; image processing; out of plane displacement measurement; out of plane tilt; surface vibration; surface vibration monitoring; system resolution; Charge coupled devices; Holographic optical components; Holography; Image analysis; Image processing; Monitoring; Optical interferometry; Pattern analysis; Speckle; Vibrations;
Conference_Titel :
Information, Communications and Signal Processing, 1997. ICICS., Proceedings of 1997 International Conference on
Print_ISBN :
0-7803-3676-3
DOI :
10.1109/ICICS.1997.652120
