Influence of fabrication tolerances and circuit variations on the performance of SAW RF filters

Author

Fisscherauer, G. ; Schropp, I.

Author_Institution

Corp. Res. & Dev., Siemens AG, Munich

fYear

1993

fDate

31 Oct-3 Nov 1993

Firstpage

257

Abstract

By simulations based on the P-matrix model, we have studied the effects of fabrication tolerances on the performance of dual-track image impedance connected filters consisting of 6 and 22 transducers, respectively, a DMS filter, and an IIDT filter. All filters were fabricated on 36°rotY,X-LiTaO₃ and operated at about 900 MHz. We have also investigated the influence of matching element variations for all four of the above-mentioned device types. It was found, for instance, that the insertion loss of the device with the smallest passband ripple (the DMS filter) changed by 1 dB for variations of 10% in the values of the matching elements while the change in the IIDT-type filter was only 0.1 dB. Since, for example in the presence of an AGC circuit, the characteristic impedances of the transmission lines connected with the SAW filter may not be constant, the results of changes in these line impedances have also been studied

Keywords

circuit analysis computing; impedance matching; radiofrequency filters; sensitivity analysis; surface acoustic wave devices; surface acoustic wave filters; ultrasonic devices; DMS filter; IIDT filter; P-matrix model; SAW RF filters; circuit variations; dual-track image impedance connected filters; fabrication tolerances; insertion loss; matching element variations; passband ripple; transmission lines; Circuits; Fabrication; Fingers; Impedance; Matched filters; Passband; Radio frequency; Surface acoustic waves; Testing; Transducers;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1993. Proceedings., IEEE 1993

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-2012-3

Type

conf

DOI

10.1109/ULTSYM.1993.339576

Filename

339576