DocumentCode :
2231166
Title :
Development and characterization of electromagnetic micro shutter in MEMS variable optical attenuator
Author :
Xuhan Dai ; Xiaolin Zhao ; Bingchu Cai
Author_Institution :
Inf. Storage Res. Center, Shanghai Jiao Tong Univ., China
fYear :
2002
fDate :
20-23 Aug. 2002
Firstpage :
63
Lastpage :
64
Abstract :
For Dynamic Power Equalization in all optical networks, a magnetically actuated, surface micromachined micro shutter in variable optical attenuator (VOA) has been fabricated and characterized. The fabrication of the micro shutter is based on the nonsilicon surface micromachine technology. The electroplated FeNi are used as the structure layer, the photoresist and Cu is adopted as the sacrificial layer. In addition, the theoretical analysis of the diffraction optical propagation through the micro shutter in the VOA has also been carried out. The analysis is based on a gaussian beam approximation to the fiber mode, a calculation of the free space diffraction past a square aperture based on the Fresnel-Kirkhoff diffraction integral, and the mode-overlap integral between the diffracted beam and the fiber mode. The theoretical calculation result is in good agreement with the experimental data. Based on the model set up, the performance of the VOA can be optimized for better adjustment characteristics.
Keywords :
electromagnetic actuators; light diffraction; micro-optics; micromachining; optical attenuators; optical elements; Cu; Cu sacrificial layer; FeNi; Fresnel-Kirkhoff diffraction integral; Gaussian beam approximation; MEMS variable optical attenuator; diffraction optical propagation; dynamic power equalization; electromagnetic micro-shutter; electroplated FeNi structure layer; fiber mode; free space diffraction; magnetic actuation; mode-overlap integral; optical network; photoresist; surface micromachining; All-optical networks; Intelligent networks; Micromechanical devices; Optical attenuators; Optical device fabrication; Optical fibers; Optical propagation; Optical surface waves; Resists; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical MEMs, 2002. Conference Digest. 2002 IEEE/LEOS International Conference on
Conference_Location :
Lugano, Switzerland
Print_ISBN :
0-7803-7595-5
Type :
conf
DOI :
10.1109/OMEMS.2002.1031444
Filename :
1031444
Link To Document :
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