DocumentCode :
2231178
Title :
Bayesian sequential estimation and evaluation of process capability indices with multiple subsamples
Author :
Zhu, H.M. ; Yu, K.M.
Author_Institution :
Coll. of Bus. Adm., Hunan Univ., Changsha, China
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
2032
Lastpage :
2036
Abstract :
Process capability analysis is designed to estimate the proportion of parts that do not meet engineering requirements in a stable production process. Using process capability indices to quantify manufacturing process precision and performance is essential part of implementing any quality improvement program. In this paper, we proposed a Bayesian sequential approach to estimate and evaluate the process capability based on multiple subsamples. Its advantage is that the parameters¿ posterior distribution in the current states is considered to be their prior distribution in the next state, thus reducing the variance of the estimators through the use of the information about the past production manufacturing process. According to the parameters¿ sequential posteriors, we establish the point estimation and the one-sided confidence interval for the process capability. Finally, we give an example to illustrate application of the proposed approach.
Keywords :
Bayes methods; manufacturing industries; manufacturing systems; process capability analysis; quality management; Bayesian sequential estimation; Bayesian sequential evaluation; manufacturing process; process capability analysis; process capability indices; quality improvement program; Bayesian methods; Design engineering; Educational institutions; Equations; Frequency estimation; Manufacturing processes; Production; Quality assurance; State estimation; Testing; Bayesian method; Estimation; Gamma distribution; Process capability index; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2629-4
Electronic_ISBN :
978-1-4244-2630-0
Type :
conf
DOI :
10.1109/IEEM.2008.4738228
Filename :
4738228
Link To Document :
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