Title :
Securing Disk-Resident Data through Application Level Encryption
Author :
Prabhakar, Ramya ; Son, Seung Woo ; Patrick, Christina ; Narayanan, Hari Krishna ; Kandemir, Mahmut
Author_Institution :
Pennsylvania State Univ., University Park
Abstract :
Confidentiality of disk-resident data is critical for end-to-end security of storage systems. While there are several widely used mechanisms for ensuring confidentiality of data in transit, techniques for providing confidentiality when data is stored in a disk subsystem are relatively new. As opposed to prior file system based approaches to this problem, this paper proposes an application-level solution, which allows encryption of select data blocks. We make three major contributions: 1) quantifying the tradeoffs between confidentiality and performance; 2) evaluating a reuse distance oriented approach for selective encryption of disk-resident data; and 3) proposing a profile-guided approach that approximates the behavior of the reuse distance oriented approach. The experiments with five applications that manipulate disk-resident data sets clearly show that our approach enables us to study the confidentiality/performance tradeoffs. Using our approach it is possible to reduce the performance degradation due to encryption/decryption overheads on an average by 46.5%, when DES is used as the encryption mechanism, and the same by 30.63%, when AES is used as the encryption mechanism.
Keywords :
cryptography; disc storage; storage management; disk subsystem; disk-resident data; disk-resident data security; encryption-decryption overheads; end-to-end security; level encryption; profile-guided approach; reuse distance oriented approach; selective encryption; storage systems; Application software; Computer science; Computer security; Conferences; Cryptography; Data engineering; Data security; Degradation; File systems; Secure storage; Data Reuse; Encryption; Input/Output.; Performance; Security;
Conference_Titel :
Security in Storage Workshop, 2007. SISW '07. Fourth International IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-0-7695-3052-9
DOI :
10.1109/SISW.2007.8