Title :
Material-specific detection and classification of single nanoparticles
Author :
Person, Steven ; Deutsch, Bradley ; Mitra, Anirban ; Novotny, Lukas
Author_Institution :
Inst. of Opt., Rochester, NY, USA
Abstract :
A material-specific dual-color common-path interferometric detection system for discriminating between nanoparticles in solution in real time is described. The detection technique is applicable to situations where both particle size and material are of interest.
Keywords :
light interferometry; nanoparticles; nanophotonics; particle size; material-specific classification; material-specific dual-color common-path interferometric detection; particle size; single nanoparticles; Gold; Materials; Nanoparticles; Optical interferometry; Optical polarization; Optical scattering;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
