Title :
The substrate noise detector for noise tolerant mixed-signal IC
Author :
Kang, Byung-tae ; Vijaykrishnan, N. ; Irwin, M.J. ; Duarte, D.
Abstract :
A new type of substrate noise detector is proposed. It is embedded in a mixed-signal IC and monitors the level of substrate noise. Voltage comparators are used to detect errors and a counter tracks the number of errors periodically. From the number of errors, the level of substrate noise is estimated using the probabilistic approach. This type of detector is useful in that it monitors substrate noise in real-time. Using this, various adaptive algorithms become feasible to reduce substrate noise. The details of the detector circuits are presented.
Keywords :
circuit simulation; comparators (circuits); counting circuits; integrated circuit design; integrated circuit noise; mixed analogue-digital integrated circuits; probability; adaptive algorithms; error counter; noise tolerant mixed-signal IC; probabilistic noise estimation; substrate noise detector; substrate noise monitoring; voltage comparators; CMOS technology; Circuit noise; Counting circuits; Detectors; Digital circuits; Integrated circuit noise; Noise level; Semiconductor device noise; Substrates; Threshold voltage;
Conference_Titel :
SOC Conference, 2003. Proceedings. IEEE International [Systems-on-Chip]
Print_ISBN :
0-7803-8182-3
DOI :
10.1109/SOC.2003.1241520
