Title :
Scheduling Semiconductor Manufacturing Plants to Reduce Mean and Variance of Cycle-Time
Author :
Lu, Steve C H ; Ramaswamy, Deepa ; Kumar, P.R.
Author_Institution :
University of Illinois
Keywords :
Fabrication; Fluctuations; Job shop scheduling; Manufacturing systems; Semiconductor device manufacture; Semiconductor device testing; Smoothing methods; System testing; Traffic control; Virtual manufacturing;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
DOI :
10.1109/ASMC.1993.682485
