• DocumentCode
    2231798
  • Title

    A Sampled Data Approach To Yield Modeling And Analysis

  • Author

    O´Donoghue, G. ; Cheek, Gary

  • Author_Institution
    Anatog Devices Semiconductor, Wilmington, MA
  • fYear
    1993
  • fDate
    18-19 Oct 1993
  • Firstpage
    97
  • Lastpage
    99
  • Keywords
    Analog integrated circuits; CMOS digital integrated circuits; Circuit testing; Density measurement; Fault diagnosis; Integrated circuit yield; Loss measurement; Manufacturing; Predictive models; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
  • Type

    conf

  • DOI
    10.1109/ASMC.1993.682488
  • Filename
    682488
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2231798