• DocumentCode
    2231819
  • Title

    Global Consistency of UHP Gas Supply APIMS Certification of On-Site Nitrogen Plants

  • Author

    Ezell, Ed ; Nakayasu, T.

  • Author_Institution
    Osaka Sanso Kogyo, Japan
  • fYear
    1993
  • fDate
    18-19 Oct 1993
  • Firstpage
    100
  • Lastpage
    100
  • Keywords
    Atmospheric measurements; Certification; Hydrogen; Ionization; Mass spectroscopy; Nitrogen; Particle measurements; Pollution measurement; Pressure measurement; Semiconductor impurities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
  • Type

    conf

  • DOI
    10.1109/ASMC.1993.682489
  • Filename
    682489