DocumentCode :
2231831
Title :
Evaluating Destructive Measurements using Gage R & R
Author :
Ackermann, Colleen Sue
Author_Institution :
MOTOROLA, Tempe, AZ
fYear :
1993
fDate :
18-19 Oct 1993
Firstpage :
101
Lastpage :
105
Keywords :
Additives; Appraisal; Electronics industry; Materials testing; Measurement standards; Reproducibility of results; Semiconductor device testing; Spirals; System testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
Type :
conf
DOI :
10.1109/ASMC.1993.682490
Filename :
682490
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2231831
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