DocumentCode
2231831
Title
Evaluating Destructive Measurements using Gage R & R
Author
Ackermann, Colleen Sue
Author_Institution
MOTOROLA, Tempe, AZ
fYear
1993
fDate
18-19 Oct 1993
Firstpage
101
Lastpage
105
Keywords
Additives; Appraisal; Electronics industry; Materials testing; Measurement standards; Reproducibility of results; Semiconductor device testing; Spirals; System testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
Type
conf
DOI
10.1109/ASMC.1993.682490
Filename
682490
Link To Document