DocumentCode
2232209
Title
Bifurcation phenomena in the Colpitts oscillator: a robustness analysis
Author
Feo, Oscar De ; Maggio, Gian Mario
Author_Institution
Dept. of Electr. Eng., Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Volume
2
fYear
2000
fDate
2000
Firstpage
469
Abstract
A robustness assessment for the results of a bifurcation analysis of the Colpitts oscillator is presented. It is shown, by means of SPICE simulations, that the bifurcation phenomena occurring in the oscillator are relatively independent of the particular choice of the transistor model. Furthermore, the simulation results exhibit good agreement with the theoretical predictions. It is also demonstrated, through circuit experiments, that the predicted behaviors can be reproduced experimentally in a robust way
Keywords
Bifurcation; Circuit simulation; Nonlinear network analysis; SPICE; Voltage-controlled oscillators; Colpitts oscillator; SPICE simulations; bifurcation phenomena; robustness analysis; transistor model; Bifurcation; Circuit simulation; Nonlinear equations; Observability; Oscillators; Predictive models; Robustness; Steady-state; Virtual colonoscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location
Geneva
Print_ISBN
0-7803-5482-6
Type
conf
DOI
10.1109/ISCAS.2000.856366
Filename
856366
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