Title :
Generic protocol for seamless control of test instrumentation towards realization of electro optical sensors
Author :
Dave, Amit ; Sharma, Jitendra ; Dutt, Ashutosh ; Sukheja, Anil
Author_Institution :
Space Applic. Center, Indian Space Res. Organ., Ahmedabad, India
Abstract :
Space Applications Center (SAC) of Indian Space Research Organization (ISRO) designs and develops electro optical sensors for earth observations and inter-planetary exploration missions. The sensors are fairly complex systems involving linear/area imaging elements, optics, electronics having large number of spectral bands, making their development a highly challenging task. To ensure in-orbit performance, the sensors are exhaustively tested on ground before being flown. XSCoPE (UNIX based Software System for Payload Evaluation) caters to the evaluation requirement throughout the development cycle of the cameras accomplishing data acquisition, parametric evaluation and optimizations. The paper describes an instrument control protocol (ICP) developed as part of the system and provides an abstraction layer in order to seamlessly interface with the test instrumentation having different underlying hardware interfaces. The protocol specifically developed for tests involving repeated measurements and automation, is scalable, generic in nature and can be adopted for different situations. Details of implementation of the protocol are given citing spectral response measurement test as a specific case to explain the idea.
Keywords :
CCD image sensors; Unix; aerospace instrumentation; optical sensors; protocols; Indian Space Research Organization; Space Applications Center; UNIX based software system; XSCoPE; abstraction layer; camera development cycle; earth observations; electro optical sensors; generic protocol; instrument control protocol; interplanetary exploration mission; payload evaluation; seamless control; test instrumentation; Automation; Cameras; Data acquisition; Instruments; Protocols; Sensors; Software; CCD; automation; checkout; instrumentation; interfaces; sensors; spectral measurement;
Conference_Titel :
Recent Advances in Intelligent Computational Systems (RAICS), 2011 IEEE
Conference_Location :
Trivandrum
Print_ISBN :
978-1-4244-9478-1
DOI :
10.1109/RAICS.2011.6069291