DocumentCode
2232288
Title
Library characterization and modeling for 130 nm and 90 nm SoC design
Author
Roethig, Wolfgang
Author_Institution
Design Solution Center, NEC Electron. America, Santa Clara, CA, USA
fYear
2003
fDate
17-20 Sept. 2003
Firstpage
383
Lastpage
386
Abstract
The tutorial associated with this white paper explains the challenges and solutions for adequate library characterization and modeling for 130 nm and 90 nm SoC design.
Keywords
integrated circuit design; integrated circuit interconnections; integrated circuit modelling; system-on-chip; 130 nm; 90 nm; SoC design; SoC modeling; interconnect analysis; library characterization; Capacitance; Frequency conversion; Impedance; Integrated circuit interconnections; Integrated circuit modeling; Libraries; Linear circuits; Temperature; Timing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2003. Proceedings. IEEE International [Systems-on-Chip]
Print_ISBN
0-7803-8182-3
Type
conf
DOI
10.1109/SOC.2003.1241548
Filename
1241548
Link To Document