Title :
Library characterization and modeling for 130 nm and 90 nm SoC design
Author :
Roethig, Wolfgang
Author_Institution :
Design Solution Center, NEC Electron. America, Santa Clara, CA, USA
Abstract :
The tutorial associated with this white paper explains the challenges and solutions for adequate library characterization and modeling for 130 nm and 90 nm SoC design.
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit modelling; system-on-chip; 130 nm; 90 nm; SoC design; SoC modeling; interconnect analysis; library characterization; Capacitance; Frequency conversion; Impedance; Integrated circuit interconnections; Integrated circuit modeling; Libraries; Linear circuits; Temperature; Timing; Voltage;
Conference_Titel :
SOC Conference, 2003. Proceedings. IEEE International [Systems-on-Chip]
Print_ISBN :
0-7803-8182-3
DOI :
10.1109/SOC.2003.1241548
