DocumentCode :
2232429
Title :
New resonant accelerometer based on rigidity change
Author :
Omura, Yoshiteru ; Nonomura, Yutaka ; Tabata, Osamu
Author_Institution :
Toyota Central Res. & Dev. Labs. Inc., Aichi, Japan
Volume :
2
fYear :
1997
fDate :
16-19 Jun 1997
Firstpage :
855
Abstract :
We propose a new resonant accelerometer based on the principle of a resonator rigidity change caused by the applied acceleration. The rigidity change of the resonator consisting of parallel beams is induced by a change in its cross-sectional shape. The feasibility of this sensing principle was confirmed by FEM analysis. A frequency change rate of 10%/g was calculated, and the sensor was fabricated by surface micromachining technology using an SOI wafer. Furthermore, we confirmed that the double resonator structure which was designed based on the same principle had a lower cross-axis sensitivity
Keywords :
accelerometers; elemental semiconductors; finite element analysis; micromechanical resonators; microsensors; silicon; FEM analysis; SOI wafer; Si; cross-axis sensitivity; cross-sectional shape; double resonator structure; feasibility; frequency change rate; parallel beams; resonant accelerometer; surface micromachining technology; Acceleration; Accelerometers; Electrodes; Fabrication; Micromachining; Particle beams; Research and development; Resonance; Resonant frequency; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
Type :
conf
DOI :
10.1109/SENSOR.1997.635236
Filename :
635236
Link To Document :
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