• DocumentCode
    2232577
  • Title

    Near field phase mapping exploiting intrinsic oscillations of NSOM probe

  • Author

    Stern, Liron ; Goykhman, I. ; Desiatov, B. ; Levy, Uriel

  • Author_Institution
    Dept. of Appl. Phys., Hebrew Univ. of Jerusalem, Jerusalem, Israel
  • fYear
    2011
  • fDate
    1-6 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    An innovative, simple compact and low cost approach for phase mapping based on the intrinsic modulation of a Near Field Scanning Optical Microscope probe is analyzed and experimentally demonstrated.
  • Keywords
    optical microscopy; optical modulation; oscillations; phase measurement; NSOM probe; intrinsic modulation; intrinsic oscillations; low cost approach; near field phase mapping; near field scanning optical microscope probe; Optical imaging; Optical interferometry; Optical mixing; Optical waveguides; Phase measurement; Phase modulation; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2011 Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4577-1223-4
  • Type

    conf

  • Filename
    5950330