Title :
Near field phase mapping exploiting intrinsic oscillations of NSOM probe
Author :
Stern, Liron ; Goykhman, I. ; Desiatov, B. ; Levy, Uriel
Author_Institution :
Dept. of Appl. Phys., Hebrew Univ. of Jerusalem, Jerusalem, Israel
Abstract :
An innovative, simple compact and low cost approach for phase mapping based on the intrinsic modulation of a Near Field Scanning Optical Microscope probe is analyzed and experimentally demonstrated.
Keywords :
optical microscopy; optical modulation; oscillations; phase measurement; NSOM probe; intrinsic modulation; intrinsic oscillations; low cost approach; near field phase mapping; near field scanning optical microscope probe; Optical imaging; Optical interferometry; Optical mixing; Optical waveguides; Phase measurement; Phase modulation; Probes;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
