DocumentCode :
2232618
Title :
Nano-scale strain mapping using near-field spectroscopy
Author :
Llopis, A. ; Pereira, S.M.S. ; Watson, I.M. ; Krokhin, A.A. ; Neogi, A.
Author_Institution :
Dept. of Phys., Univ. of North Texas, Denton, TX, USA
fYear :
2011
fDate :
1-6 May 2011
Firstpage :
1
Lastpage :
2
Abstract :
A technique is presented for mapping the strain in light-emitting nano- and hetero structures using near-field spectroscopy. This technique makes use of theoretical calculations to extract the strain from near-field data.
Keywords :
light emitting devices; nanophotonics; spectroscopy; light emitting heterostructures; light emitting nanostructures; nanoscale strain mapping; near-field spectroscopy; Couplings; Gallium nitride; Optical imaging; Phonons; Quantum well devices; Spectroscopy; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
Type :
conf
Filename :
5950332
Link To Document :
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