Title :
New metrics for architectural level power performance evaluation
Author :
Jia, Lihong ; Gao, Yonghong ; Tenhunen, Hannu
Author_Institution :
Electron. Syst. Design Lab., R. Inst. of Technol., Stockholm, Sweden
Abstract :
In this paper, we present new metrics to evaluate the performance of VLSI circuits with regards to the power consumption in the architectural level from the system point of view. One advantage of the new metrics is that the metrics not only calculate the power consumption itself but also evaluate the “low power possibility” of the architectures from the system point of view; another advantage is that the metrics consider the effects of the process technology and it can be used to evaluate the power consumption performance in the future advanced VLSI technology. Specially, we point out that reducing power supply voltage to reduce the power consumption will become less and less efficient in the deep submicron regime and thus the architecture-driven voltage scaling low power design approach will not work as well as in the previous technology
Keywords :
VLSI; integrated circuit design; low-power electronics; VLSI circuits; architectural level power performance evaluation; architecture-driven voltage scaling; deep submicron regime; power consumption evaluation metrics; process technology effects; Circuits; Costs; Energy consumption; Laboratories; Low voltage; Power supplies; Silicon; System performance; Throughput; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.856387