DocumentCode :
2233404
Title :
Noise and Jitter Transfer Characteristics of an On-chip Voltage Reference-Locked Loop
Author :
Nissinen, Ilkka ; Kostamovaara, Juha
Author_Institution :
Dept. of Electr. & Inf. Eng., Univ. of Oulu, Oulu, Finland
fYear :
2008
fDate :
16-17 Nov. 2008
Firstpage :
212
Lastpage :
216
Abstract :
The noise and jitter characteristics of an on-chip voltage reference-locked ring oscillator are presented. The frequency of the ring oscillator, 683 MHz, was locked to the on-chip voltage reference by means of a frequency-to-voltage converter and the noise and jitter transfer characteristics of this loop were derived, including the noises of the reference voltage and ring oscillator. Simulations were performed to see the effects of different noise types (white and 1/f noise) on the cumulative jitter of the locked ring oscillator. Finally, these results were verified by jitter measurements performed using an integrated time-to-digital converter (TDC) fabricated on the same die (0.18 ¿m CMOS process).
Keywords :
jitter; noise; oscillators; phase locked loops; voltage-frequency convertors; frequency-to-voltage converter; integrated time-to-digital converter; jitter transfer; noise; on-chip voltage reference-locked loop; ring oscillator; size 0.18 mum; Circuits; Feedback loop; Frequency conversion; Frequency locked loops; Jitter; Phase locked loops; Phase noise; Ring oscillators; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NORCHIP, 2008.
Conference_Location :
Tallinn
Print_ISBN :
978-1-4244-2492-4
Electronic_ISBN :
978-1-4244-2493-1
Type :
conf
DOI :
10.1109/NORCHP.2008.4738314
Filename :
4738314
Link To Document :
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