DocumentCode :
2233442
Title :
A cross-check test scheme for infrared focal plane array
Author :
Sheu, Meng Lieh ; Shie, Man Chau ; Sun, Tai Ping ; Jih, Far Wen
Author_Institution :
National Chi-Nan University
fYear :
2002
fDate :
8-8 Aug. 2002
Firstpage :
109
Lastpage :
112
Keywords :
Built-in self-test; CMOS technology; Circuit testing; Dark current; Electronic equipment testing; Infrared detectors; Photovoltaic systems; Radiation detectors; Sensor arrays; Solar power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2002. Proceedings. 2002 IEEE Asia-Pacific Conference on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-7363-4
Type :
conf
DOI :
10.1109/APASIC.2002.1031544
Filename :
1031544
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2233442
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