• DocumentCode
    2233924
  • Title

    Growth and properties of (KNa)0.1(Sr0.75Ba0.25)0.9Nb2O6 thin films by pulsed laser deposition

  • Author

    Zhang, Y.L. ; Yang, S.H.

  • Author_Institution
    State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
  • fYear
    2009
  • fDate
    23-27 Aug. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Epitaxial (KNa)0.1(Sr0.75Ba0.25)0.9Nb2O6 (KNSBN:75) thin films deposited on MgO(100) substrate have been prepared by pulsed laser deposition (PLD). The structural properties of the thin films were studied by X-ray diffraction. X-ray diffraction 2thetas and phi scan indicate single crystalline layers with the (001) orientation perpendicular to the substrate plane. The micro-Raman spectra and optical transmission spectra of the KNSBN:75 films have been obtained. The optical constants (refractive index n and the extinction coefficient k) are determined. It is found that the optical properties of the KNSBN:75 films is almost same as that of KNSBN:75 single bulk crystal.
  • Keywords
    Raman spectra; X-ray diffraction; barium compounds; crystal orientation; epitaxial layers; extinction coefficients; ferroelectric thin films; optical constants; potassium compounds; pulsed laser deposition; refractive index; sodium compounds; strontium compounds; (001) orientation; (KNa)0.1(Sr0.75Ba0.25)0.9Nb2O6; MgO; X-ray diffraction; epitaxial thin films; extinction coefficient; ferroelectric materials; microRaman spectra; optical constants; optical properties; optical transmission spectra; pulsed laser deposition; refractive index; single crystalline layers; structural properties; Niobium; Optical diffraction; Optical films; Optical refraction; Optical variables control; Pulsed laser deposition; Sputtering; Strontium; Substrates; X-ray diffraction; KNSBN thin films; PLD; Raman spectra;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
  • Conference_Location
    Xian
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-4970-5
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2009.5307573
  • Filename
    5307573